
Industrial Microscopy & Video Measuring System
Nikon's ECLIPSE L300ND, L300N and L200ND, L200NA is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.
The highest level of optical quality, operability, and stability for polarized light microscopy.
The newly developed high-intensity 50W halogen light source is brighter than a conventional 100W halogen lamp. Low power consumption means less heat generation, thereby reducing the chance of heat-induced focus drift.
The VMZ-S series provides three types of measuring envelope together with a range of high quality optics, complete with a TTL (through the lens) scanning laser as standard. Capable of high-accuracy, high-speed measurement for fulfilling increasingly demanding inspection applications, the VMZ-S series is used in a wide range of industries.
Nikon’s NEXIV VMF-K Series is an advanced confocal optical measurement system that enhances speed and precision. It efficiently analyzes complex geometries, high-contrast surfaces, and transparent materials, offering integrated 2D and 3D measurement for faster, more comprehensive quality control.